Non-Contact Depth Measuring Microscope System DH2/IMH
High-precision non-contact depth measurement is possible with observing the surface of measuring point, by very simple operation, without personal equations.
Hisomet is a non-contact depth measuring microscope system.
Designed based on an optical type focal point detection system.
Adopting precise focus indicator, it's possible to measure height, depth, steps, etc. with observing the surface of measuring point, by simply coinciding the halves of an index graticule (Target Mark).
Since there is no concern for physical damages such as distortion, blow or nicks to a specimen because of non-contact system, Hisomet is optimum for measuring electronic components such as ICs or high-precision processing parts.
HISOMET-II:DH2
HISOMET realizes non-contact, high-precision height/depth measurement with simple operation, observing the surface of measuring point.
HISOMET-II is a non-contact depth measuring microscope that has been designed based on an optical type focal point detection system. Adopting precise focus indicator, it's possible to measure height, depth, steps, etc. with observing the surface of measuring point, by simply coinciding the halves of an index graticule.
Since there are no concern for physical damages such as distortion, blow or nicks to a specimen because of non-contact system, HISOMET is optimum for measuring electronic components such as ICs or high-precision processing parts.
DH2-150
DH2-150 is a X/Y/Z measuring system having a large size stage (150x150mm travel) with
precise focus indicator (Target Mark) of HISOMET and high magnification lenses.
High-precision non-contact depth measuring microscope incorporating the optical system of HISOMENT-II (DH2), specialized as Z axis measuring unit, exclusively designed to be integrated into production line or equipment.
Incorporating DH2 (HISOMET-II)'s optical system, which enables to measure height, depth, steps, etc. with observing the surface of measuring point, by simply coinciding the halves of an index graticule, IMH was developed as a smaller and lighter microscope unit having excellent cost-effectiveness. IMH can be installed into various kinds of equipment of production, testing, inspection, evaluation, etc., as a built-in microscope unit.
Union Optical was established in 1948 in Japan, had worked hard for offering user high quality and high-accuracy optics measuring equipment. It is affirmed to contain 3D measuring microscope, IR microscope, double view microscope and Wafer thickness measuring equipment etc in semiconductor and electronics industries.