DZ4 Zoom Ratio of 10 : Stepless Magnification Change from 350x to 3500x without changing lens (with objective ZC70). It is possible to reach the observation position quickly at low magnification and magnify the image then and there to the maximum. DZ2 can be used with various types of illuminations. It has a wide application. The resolution is so high that a very clear picture is available even when the microscope is used with a large monitor. Specifications Objectives ZC5 0.42∼5x W.D. 45 mm (Total Magnification25.2∼300x) ZC15 1.25∼15x W.D. 46.2mm (Total Magnification 75∼900x) ZC30 2.5∼30x W.D. 35.25mm (Total Magnification 150∼1800x) ZC50 4.16x - 50x W.D. 14 mm (Total Magnification 249.6-3000x) ZC70 5.83x - 70x W.D. 7.1mm (Total Magnification 349.8x - 4200x) Zoom Ratio 12 Image Observation by TV monitor(Image input by CCD video camera of C mount type) Illumination Coaxial Reflecting Illuminator (Fibre Optics) UWZ285/210 210mm or 285mm Long Working Distance Zoom Microscope. Longer W.D. can achieve observing specimens being out of reach before. Coaxial Reflecting Illumination as standard equipment can make image brighter and clearer. Having wide range of total magnification. UWZ210: 42X to 588X UWZ285: 30X to 420X Specifications Item UWZ210 UWZ285 Zoom ratio 14 Optical magnification 0.7X to 9.8X 0.5X to 7.0X W.D. 210mm (fixing) 285mm (fixing) N.A. 0.014 to 0.093 0.01 to 0.067 Resolution (e-ray) (figuring out theoretically) 24μm to 3.6μm 33.5μm to 3.0μm Focal depth (e-ray) (figuring out theoretically) ±1,400μm to ±31μm ±2,750μm to ±62μm Field Number/objective side o11.4mm to o0.8mm o16.0mm to o1.1mm Field Number/viewing side o8mm C-Mount (applicable to 1/2"CCD camera) Corrected Wave Length 400μm to 700μm Illumination Coaxial Reflecting Illumination (standard equipment)

Union Optical was established in 1948 in Japan, had worked hard for offering user high quality and high-accuracy optics measuring equipment. It is affirmed to contain 3D measuring microscope, IR microscope, double view microscope and Wafer thickness measuring equipment etc in semiconductor and electronics industries.