| Brands | Sample img | product | Applications | Contact |
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ASH Transforming inspection |
Transforming inspection,Measurement and Data recording with our digital microscope. |  |
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CHUO Optical fine defect measuring instrument |
Touch screen peripheral electrode defect detection, sheet surface scratches, foreign body detection, substrate defect detection. | |
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HIROX 3D Digital Microscope |
with 3D depth level and sharp images, up to a full range of observations for many purposes. | |
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INSPECVISION High Speed Flatness Measuring Instrument |
visual measurement for sheet metal | |
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JDI&KUNOH Non-Contact 3D measurement |
solder ball height, camber gold, copper height, and wafer height / depth, height / depth testing of electronics, machinery and all kinds of products. | |
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LTF Horizontal/Vertical Projection System |
inspection of machinery, mold, electronics, semiconductor parts and finished product . | |
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LTF 2D Optical measurement instrument |
dental and medical biotechnology industry, aerospace industry and motor vehicles, watches, gears, connectors and other metal processing industries. | |
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MCRL MCRL Color measuring machine, gloss machine, haze / transparency measuring machine |
Color management of tinted materials for dyestuff, pigment, printing ink . Spectrophotometric color measurement for CCM processing in color coordination industries Solution to the color difference of painting, dyeing, tinted plastics. | |
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MEC Optical Surface Inspection System |
optical substrate, optical film, metal, glass, cloth, paper roll, lithium cells and isolated membranes. | |
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NISSHO Non-contact Depth Measuring Microscope System |
wafer trench depth measurement, liquid sealant, glue thickness measurement, the etching depth of the lead frame, solder ball thickness of circuit board . | |
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UNION Industrial Measuring Microscope |
IC packaging industry, machinery industry, academic and research institutions. | |
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UNION High Magnification 2D Microscope |
semiconductor industry, metal surface, and chemical materials | |
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UNION High Magnification Zoom Microscope |
electronics, machinery, semiconductor and any long working distance inspection needed products | |
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UNION Double View Microscope |
superimposing top and bottom patterns of specimen (wafer) in the view field of microscope, then comparing shift to measure the shift length by measuring system ( applicable to wafers up to 4 and 6 inches in diameter) | |
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UNION Non-contact Thickness/Height/Depth Measuring System |
thickness measurement of suspended membrane material of MEMS, the thickness after back grinding, and thickness measurement of various film | |
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VITO Non-contact Industrial Measuring Microscope |
testing of size and visual inspection in machinery, mold, electronics, semiconductors, plastics, printing, aviation and other industries | |